НИВЦ МГУ
имени М. В. Ломоносова

Research

Computing Center

Lomonosov Moscow

State University

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Computational experiments on optical coating production using monochromatic monitoring strategy aimed at eliminating a cumulative effect of thickness errors

Tikhonravov Alexander, Trubetskov Michael K., Arnotchkina Tatiana V.

Effects of interface roughness on the spectral properties of thin films and multilayers

Tikhonravov A.V., Trubetskov M.K., Tikhonravov A.A., Duparre A.

Automated construction of monochromatic monitoring strategies

Trubetskov M., Amotchkina T., Tikhonravov A.

Optical coating design approaches based on the needle optimization technique

Tikhonravov A.V., Trubetskov M.K., DeBell G.W.

Topical meeting on Optical Interference Coatings (OIC'2001): design contest results

Thelen A., Tilsch M., Tikhonravov A.V., Trubetskov M.K., Brauneck U.

Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films

Tikhonravov A.V., Trubetskov M.K., Kokarev M.A., Amotchkina T.V., Duparre A., Quesnel E., Ristau D., Gunster S.

Reliable optical characterization of e-beam evaporated TiO2 films deposited at different substrate temperatures

Amotchkina T., Trubetskov M., Tikhonravov A., Angelov I.B., Pervak V.

Investigation of the error self-compensation effect associated with broadband optical monitoring

Tikhonravov Alexander, Trubetskov Michael K., Amotchkina Tatiana V.

Estimation of the average residual reflectance of broadband antireflection coatings

Tikhonravov Alexander, Trubetskov Michael K., Amotchkina Tatiana V., Dobrowolski J.A.

Spectroscopic ellipsometry of slightly inhomogeneous nonabsorbing thin films with arbitrary refractive-index profiles: theoretical study

Tikhonravov A.V., Trubetskov M.K., Krasilnikova A.V.

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119991, Russian Federation, Moscow, GSP-1, Leninskie Gory, 1 , p. 4, RCC MSU
+7 495 939-5424,
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