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имени М. В. Ломоносова
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Our publications
Measurement of group delay of dispersive mirrors with white-light interferometer
Amotchkina Tatiana V., Tikhonravov Alexander, Trubetskov Michael K., Grupe Dirk, Apolonski Alexander, Pervak Vladimir
Optical parameters of oxide films typically used in optical coating production
Tikhonravov Alexander, Trubetskov Michael K., Amotchkina Tatiana V., DeBell Gary, Pervak Vladimir, Sytchkova Anna Krasilnikova, Grilli Maria Luisa, Ristau Detlev
Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation
Ristau D., Gunster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.
Elimination of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory
Tikhonravov A.V., Trubetskov M.K.
Influence of small inhomogeneities on the spectral characteristics of single thin films
Tikhonravov A.V., Trubetskov M.K., Sullivan B T., Dobrowolski J.
Modern design tools and a new paradigm in optical coating design
Tikhonravov Alexander V., Trubetskov Michael K.
Investigation of the effect of accumulation of thickness errors in optical coating production by broadband optical monitoring
Tikhonravov Alexander V., Trubetskov Michael K., Amotchkina Tatiana V.
Reverse engineering of multilayer coatings for ultrafast laser applications
Trubetskov M., Amotchkina T., Tikhonravov A., Pervak V.
Comparison of two techniques for reliable characterization of thin metal-dielectric films
Amotchkina Tatiana V., Trubetskov Michael K., Tikhonravov Alexander, Janicki Vesna, Sancho-Parramon Jordi, Zorc Hrvoje
Band filters: two-material technology versus rugate
Pervak V., Tikhonravov A.V., Trubetskov M.K., Pistner J., Krausz F., Apolonski A.
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RCC journal
Journal "Numerical methods and programming"