НИВЦ МГУ
имени М. В. Ломоносова

Research

Computing Center

Lomonosov Moscow

State University

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Measurement of group delay of dispersive mirrors with white-light interferometer

Amotchkina Tatiana V., Tikhonravov Alexander, Trubetskov Michael K., Grupe Dirk, Apolonski Alexander, Pervak Vladimir

Optical parameters of oxide films typically used in optical coating production

Tikhonravov Alexander, Trubetskov Michael K., Amotchkina Tatiana V., DeBell Gary, Pervak Vladimir, Sytchkova Anna Krasilnikova, Grilli Maria Luisa, Ristau Detlev

Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation

Ristau D., Gunster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.

Elimination of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory

Tikhonravov A.V., Trubetskov M.K.

Influence of small inhomogeneities on the spectral characteristics of single thin films

Tikhonravov A.V., Trubetskov M.K., Sullivan B T., Dobrowolski J.

Modern design tools and a new paradigm in optical coating design

Tikhonravov Alexander V., Trubetskov Michael K.

Investigation of the effect of accumulation of thickness errors in optical coating production by broadband optical monitoring

Tikhonravov Alexander V., Trubetskov Michael K., Amotchkina Tatiana V.

Reverse engineering of multilayer coatings for ultrafast laser applications

Trubetskov M., Amotchkina T., Tikhonravov A., Pervak V.

Comparison of two techniques for reliable characterization of thin metal-dielectric films

Amotchkina Tatiana V., Trubetskov Michael K., Tikhonravov Alexander, Janicki Vesna, Sancho-Parramon Jordi, Zorc Hrvoje

Band filters: two-material technology versus rugate

Pervak V., Tikhonravov A.V., Trubetskov M.K., Pistner J., Krausz F., Apolonski A.

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+7 495 939-5424,
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