Our publications

Estimates of initial conditions ot'parabolic equations and inequalities in infinite domains via lateral Cauchy data

Klibanov Michael, Tikhonravov Alexander

Quasi-optimal synthesis for antireflection coatings - a new method

Tikhonravov Av, Dobrowolski Ja

On the reliability of reverse engineering results

Amotchkina T., Trubetskov M., Pervak V., Romanov B., Tikhonravov A.V.

Production of Brewster angle thin film polarizers using a ZrO2/SiO2 pair of materials

Tikhonravov A.V., Zhupanov V.G., Fedoseev V.N., Trubetskov M.K., Kozlov I.V., Konotopov P.

Indirect broadband optical monitoring with multiple witness substrates

Zhupanov Valery G., Klyuev Evgeny V., Alekseev Sergey V., Kozlov Ivan, Trubetskov Michael K., Kokarev Michael, Tikhonravov Alexander

Measurement of group delay of dispersive mirrors with white-light interferometer

Amotchkina Tatiana V., Tikhonravov Alexander, Trubetskov Michael K., Grupe Dirk, Apolonski Alexander, Pervak Vladimir

Optical parameters of oxide films typically used in optical coating production

Tikhonravov Alexander, Trubetskov Michael K., Amotchkina Tatiana V., DeBell Gary, Pervak Vladimir, Sytchkova Anna Krasilnikova, Grilli Maria Luisa, Ristau Detlev

Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation

Ristau D., Gunster S., Bosch S., Duparre A., Masetti E., Ferre-Borrull J., Kiriakidis G., Peiro F., Quesnel E., Tikhonravov A.

Elimination of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory

Tikhonravov A.V., Trubetskov M.K.

Influence of small inhomogeneities on the spectral characteristics of single thin films

Tikhonravov A.V., Trubetskov M.K., Sullivan B T., Dobrowolski J.

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119991, Russian Federation, Moscow, GSP-1, Leninskie Gory, 1 , p. 4, RCC MSU
+7 495 939-5424,
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Our publications

Estimates of initial conditions ot'parabolic equations and inequalities in infinite domains via lateral Cauchy data

Quasi-optimal synthesis for antireflection coatings - a new method

On the reliability of reverse engineering results

Production of Brewster angle thin film polarizers using a ZrO2/SiO2 pair of materials

Indirect broadband optical monitoring with multiple witness substrates

Measurement of group delay of dispersive mirrors with white-light interferometer

Optical parameters of oxide films typically used in optical coating production

Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation

Elimination of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory

Influence of small inhomogeneities on the spectral characteristics of single thin films

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